In recent years we study the optical properties of the deep levels in InGaAs/GaAs quantum dot structures. I would be happy to discuss this subject with those who study it in the present or past.
Having used thermally stimulated conductivity (TSC) technique, we identified deep electron traps that produce strong effects on charge carrier transport and photoconductivity in InGaAs/GaAs quantum dot (QD) structures. The values of deep levels below the conduction band of GaAs at 0.16, 0.22, and 0.35 eV are obtained from the analysis of the shapes of TSC curves after the excitation with the quanta energy hv = 0.9, 1.2, and 1.6 eV. The level 0.16 eV in depth is an effective electron trap that provides crossing of lateral conductivity with a high-resistance mode and, therefore, causes a high photocurrent sensitivity of about 3 A/W at 77 K with excitation by interband transitions in QDs. The state at Ec – 0.22 eV is shown to be related to the recombination center that can hold non-equilibrium holes over a long time under the condition that the non-equilibrium holes are localized by the quantum states of QDs.
Article Effect of carrier capture by deep levels on lateral photocon...
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