I need to analyze experimentally the degradation due to NBTI of the delay of a digital circuit (e.g: a Ring Oscillator). Can anyone suggest which lab equipment I may need?
Hi,
I think a simple CRO or a DSO with DMM will serve your purpose.
You can measure the impact of NBTI at a lower accuracy by the following method.
1. Transistor parameter monitoring: This technique is based on monitoring the selected transistors to measure NBTI impact on the circuit. Monitor the transistor drain current, threshold voltage, and transconductance to quantify the impact. And monitor the transistor leakage current to characterize NBTI.
2. Circuit parameter monitoring: This technique is based on monitoring the circuit parameters to measure NBTI impact. Monitored the beat frequency of two ring oscillators one stressed and the other unstressed, to characterize the impact. Characterize NBTI in termsof the control voltage of the two delay locked loops.
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