There should be peaks around 1090 cm^-1 (TO) and 1256 cm^-1 (LO). I read that in transmission only the TO absorption peak is visible, but in reflectance both should be visible. However there also we only see the TO peak, but the operator had no experience with measuring thin oxide layers, so maybe we did something wrong. What kind of setup should be used and what should be taken into account?
No, but this was also not done in the measurement that I am trying to replicate and there they did see both peaks. But you think ATR would help?
Did you try the deconvolution of the main pick, or more measuring cicles?
The peaks should be similar in height, so what do you mean by the main peak? We averaged over multiple measurements until we had a more or less smooth curve.
In a such way, all the interesting parameters, i.e. refraction index at the film surface,refraction index at the substrate−filminterface
and the scattering parameter, could be calculated as a function of wavelength
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