I am trying to extract the real and imaginary dielectric constant for a 2D semiconductor with alternating layers of high and low dielectric (a quantum well material). I am using a Wollam Ellipsometer with their software and cannot produce a meaningful fit for the raw data.
Are there any tricks towards finding the correct model? Also, I have a general idea of what the dielectric constant should be for each layer (6.1 and 2.1) and the models I've produced are not where close to that.
Which semiconductor 2D you desire to caractérise by ellipsometry?
And how you elaborate your sample? It's necessary to find the correct model!!
When you are trying to obtain dielectric constants of a material it is often necessary to make a simplified sample. Ideally you should make single layer samples of each material in the quantum well stack with thicknesses greater than 1000 angstroms. From these single layer samples you can obtain accurate dielectric constants for each material. Once you have determined the dielectric constants you can go back to the quantum well stack and do more in-depth studies of the stack.
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