I am using source measurement unit to plot i-v value of nanocomposite samples, but i am not getting proper results. Please suggest me better procedure to get proper results.
How are you connecting the SMU to the sample in order to perform the measurement? I assume you are using a 'four point probe"/"Kelvin" setup. What do you mean by "not getting proper results" - please can you be more specific?
Often the issue is related to making a good quality connection to the test instrument. If you are using micropositioners with needle probes it is very important you use a microscope to ensure that contact is made and the needles do not pierce strate through the test layer.
For very delicate surfaces I sometimes purposefully (and carefully) bent the end of the probe needle to form a hook-like shape. This way, the needle can 'skate' slightly on contact with the delicate surface and in my experience was less likely to pierce through the layer.
I also attach a document from Keysight technologies that you may find useful.