I am working with different nanoparticles
I will need software also
When the AFM technique is applied, the images obtained directly from the microscope are bidimensional. With the use of WSxM software, which can be found free on the internet, such images can be processed. In this software there are several ways to process them depending on what the researcher needs. In the case of estimating the sizes of the nanoparticles there are an option that appears in the toolbar of the software that, when activated, allows the determination of roughness profiles. From there the size in the z direction is estimated and at half the height of each profile the size is estimated in the x or y directions.
Best regards,
Manuel.
Hi Santhosh,
You may refer to the related issues on Researchgate:
- https://www.researchgate.net/post/How_to_calculate_the_grain_size_by_AFM
- https://www.researchgate.net/post/how_to_get_grain_boundary_map_from_sem_images
- https://www.researchgate.net/post/When_undertaking_AFM_roughness_is_there_any_model_for_sampling_to_determine_the_number_of_points_and_measurements_to_take
- https://www.researchgate.net/post/How_to_measure_sidewall_roughness2
Regards
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