Below I've attached the image I got from SAED of my material and I'm trying to determine the d spacing and ultimately its hkl values. I used Fiji image J TEM suite for my other samples which were polycrystalline.
The d spacing from SAED pattern can be determined by measuring the distance between two adjacent bright spot. The measured distance should be inversed to get the d values in nanometer.
These values should be compared with the JCPDS file to get hkl value.
There are two problems:
1. You need to know the precise error in your camera length (i.e. the magnification calibration of your diffraction pattern). You want an error
Concerning the first answer: please do not compare it with d-spacings from a JCPDS file (or take it only as a start), but with a simulated diffraction pattern based on the known crystal structure (for the suspected zone axis). And consider the angles between the reciprocal lattice vectors and not only the d spacings.
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