We collect our diffusion reflectance spectra of powders with semiconducting properties and a question came up - if every time when we change the samples we should adjust the optical alignment?
Especially, in the case of background and sample measurements we doubt if the change of sample holder height affects the results significantly. Can anybody please comment how to collect data correctly in order to calculate the bandgap from a Tauc plot properly?
Not sure about diffuse reflectance measurements, but sample height does make a difference with specular reflectance measurements. If it's an integrating sphere detector, and there's a gap between sample and sphere wall, you could maybe be losing some of the wider-angle scatter?
not sure about diffuse reflectance measurements either. For the reflectance measurement of single crystals, we need to adjust the alignment every time so the maximum reflectance signal can be obtained.
thanks a lot for your suggestions. We do not have an integrating sphere detector. Hence, I think data collection with the best reflectance signal for each sample is reliable.
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