I would like to investigate the crystalline nature of individual nanoparticles.. Do I get the same sort of information from using these two...? I found a lot of reference on how to interpret SAED patterns but not so much for analysing FFT image...I have already obtained a few FFT images of my TiO2 NPs, but not so sure how to explain them. Any suggestion, please...? Thank you.
Simply speaking, DP contains more information than FFT. Because DP comes from back focal plane but FFT comes from image plane. If you want to observe the defects/dislocations in your tio2 sample, I suggest you to use FFT as well as IFFT mode, which can show the dislocations apparently.
Could anyone explains on how to interpret the indexing pattern which corresponding to hkl miller indices with the use of FFT?
I hope this link will help you ;
http://imagej.nih.gov/ij/docs/examples/tem/
Regards,
Thanks for the information, I found it is very interesting.
In principle, it is possible to obtain the lattice images by inverse FFT the SAED image, but technically, it requires to assign frequency domain to the SAED image so that the lattice image can be reconstructed from the SAED image. I am trying to do so by imageJ, but I don't know how to set up the frequency domain though. I am wondering if anyone has experience on it, this can be very useful for me.
Thanks
My compound is polycrystalline in nature, I got different FFT and SAED for the same location... What it means???
I think it is because the surface structure and bulk structure of your material are different. The result you got from FFT on TEM image is fourier transfer the microscopic image (based on software calculation) ,which is usually morphological image of the material surface. However, you are doing FFT using the electron diffraction when you applied SAED, this process is not based on software calculation. The information you got via SAED includes both surface and bulk structure. Thus, I suppose unless the surface structure and bulk structure signal are identical or you could not get the same FFT pattern with SAED.
I suppose your composite is in different crystalline plane and is possibly showing mix phase due to phase transformation. I am sure IFFT will give you a clearer information.
In Imag J software, it giving a error for IFFT, it need frequency domain image for doing IFFT, and I don't know, I have image in JPG, and DM3. format... Another if somebody have a litrature link, where I can find d-spacing with respect to miller indices of different materials, please share me.
Thanks
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