Subhasisa Nath

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Questions related from Subhasisa Nath

Is it necessary for a amorphous material to show broad hump in X-ray diffraction profile?

I did XRD of both yttria stabilized zirconia (YSZ) and alumina (Al2O3) thin films both of which were found to be amorphous using TEM. The XRD also indicated amorphous nature. However, in YSZ, I...

07 August 2014 3,242 7 View

Thickness drop at substrate temperature of 573 k in pulsed laser deposition - any thoughts?

I deposited YSZ films by PLD. What I see that at RT deposition, a maximum thickness was achieved which sharply decreases to the minimum value at 573 K. With increase in substrate temperature...

10 May 2014 6,340 2 View

How to identify non-transformable tetragonal peaks in XRD as no such phase exists in the database?

While analyzing XRD of yttria stabilized zirconia (YSZ), I found some peaks at around 73-74. Some peaks were matching with JCPDS database of zirconia. When I saw the literature, I found...

10 August 2013 9,864 15 View