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Questions related from Subhasisa Nath
I did XRD of both yttria stabilized zirconia (YSZ) and alumina (Al2O3) thin films both of which were found to be amorphous using TEM. The XRD also indicated amorphous nature. However, in YSZ, I...
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I deposited YSZ films by PLD. What I see that at RT deposition, a maximum thickness was achieved which sharply decreases to the minimum value at 573 K. With increase in substrate temperature...
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While analyzing XRD of yttria stabilized zirconia (YSZ), I found some peaks at around 73-74. Some peaks were matching with JCPDS database of zirconia. When I saw the literature, I found...
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