2 Questions 1 Answers 0 Followers
Questions related from Reshma Raveendran
I wanted to test the bias stability of an OFET. From the literature it is found that the gate and drain voltages need to be kept constant and measure drain current variation as a function of time....
10 February 2018 4,536 1 View
I actually want to know which structure should be used to find the capacitance,i.e., Metal-Insulator-Metal(MIM) or Metal-Insulator-Semiconductor (MIS) structure.
03 April 2015 8,103 3 View