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Questions related from Piotr Pokryszka
My task is the measurement of the reflection spectrum of the surface of a semiconductor structure. I am using a Xenon lamp as the light source. I am using an Ocean Optics USB4000 spectrometer as...
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I would like to calculate the n and k of an approximately 1410 nm thick layer (GaN) deposited on a sapphire substrate by MOVPE at 1050 C, I have the reflectance spectrum of R = f(lambda) and the...
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I would like to make photoluminescence measurements of GaN material at room temperature. At the moment I do not have a laser that I could use for this purpose. Can I replace the laser with an...
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