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Questions related from Khursheed Parrey
Increasing the thickness of ETL in photovoltaic device lowers the Fill factor and efficiency as well. However in one of the devices with only different HTL than first device, the efficiency...
09 September 2019 7,620 4 View
Generally Substances with a forbidden band widths Wg < 2eV are considered to be semiconductors while those substances for which Wg > 3eV belong to dielectrics. Now, the question goes like if...
04 April 2019 6,322 5 View
Dark colored powders are to be characterized by UV-Visible spectroscopy technique, which mode among diffuse reflectance, absorbance or transmittance is suitable to record the spectra?? the...
11 November 2018 5,349 2 View
While performing X-Ray diffraction measurement, which of the following is true (1) the diffraction from only a point structure on the sample is characterized (2) diffraction from an area is...
10 October 2018 3,610 3 View
In the xrd measurement of the pure and doped materials, it has been observed that few peaks are shifted due to doping. What could be the possible reasons for this X-Ray peak shifting??
10 October 2018 1,888 6 View
Which form of the sample (thin film/powder/pellet) is better for carrying out XPS measurement? I have heard that thin films are better. Please comment
10 October 2018 7,929 2 View