When doing I-V characterization, why is there both ohmic and Schottky contact for a single sample of thin ZnO film on P-Type silicon?

We deposited a thin ZnO film on P-Type silicon wafers by sol-gel spin coating using gold as a metal contact. We have found the thin films were composed by nano particles. As shown in the figure,...

27 January 2014 5,063 1 View