Chun Wei Khor

4 Questions 3 Answers 0 Followers

Questions related from Chun Wei Khor

Reliability Impact of Nitride Spacer Residue on FOX and Poly?

I am observing small Nitride Spacer residue on top Poly layer and FOX. Would like to ask are there any impact on the reliability of the transistors due to the residue

14 October 2021 2,076 0 View

What could be the cause of IDSS failure after THB test which is recoverable with oven bake?

Increase %P of BPSG to solve HTRB Vth drift issue but result in IDSS failure after THB test.

31 May 2017 3,281 0 View

Reason for the discrepancy in results for wafer level test of HTRB condition compared to Packaged level?

Large Vth drift observed at HTRB Packaged level after 168hr. However, when tested at same condition at wafer level , no significant vth drift observed. What could be the reason for the discrepancy...

20 February 2017 8,919 4 View

What are the causes of Vth drift after HTRB backend reliability test?

Cause of HTRB Failure

17 February 2017 7,394 4 View