Chun Wei Khor

2 Questions 3 Answers 0 Followers

Questions related from Chun Wei Khor

Reason for the discrepancy in results for wafer level test of HTRB condition compared to Packaged level?

Large Vth drift observed at HTRB Packaged level after 168hr. However, when tested at same condition at wafer level , no significant vth drift observed. What could be the reason for the discrepancy...

20 February 2017 8,908 4 View

What are the causes of Vth drift after HTRB backend reliability test?

Cause of HTRB Failure

17 February 2017 7,382 4 View