You may wish to consult the attached publication by Lian and Sottos (J. Appl. Phys. 87, 3941 (2000)), where the piezoelectric constant d33 is reported as increasing with increasing film thickness. The authors interpret this effect as arising from the residual stress in the film which decreased with increasing film thickness. This issue can be naturally clarified on the basis of microscopic calculations.

http://scitation.aip.org/content/aip/journal/jap/87/8/10.1063/1.372439

 Thanks sir..

You are welcome!