We have performed linear scanning (B-scan)by keeping a transmitter fixed and receiver scanned away over the defective region in composite. After wavelet denoising, we have to find location and size of defect. One way is to compare the normalized amplitudes of all A-scans along the distance. What are the other ways if amplitude detection cannot be applied ( amplitudes in defect-free regions are not similar)? Do we need to compare spectral components after applying EMD/EEMD or STFT?