We are constructing a confocal microscope to study electron spin configurations in semiconductor nanostructures. For this, we are using an incident laser beam linearly polarized (630 nm) and the objective is to obtain a circularly polarized signal with the help of a quarter-wave plate, after interacting with the sample. However we have some troubles because the beamsplitters that we tested modify the signal polarization to an elliptical one (cubic beamsplitter) or make alignment very difficult (plate and wedged plate beamsplitters). Someone there has some suggestions on type of mechanical components, beamsplitters and/or microscope configurations to to get better results in this type of measure? I will be very grateful with the help.
Dear colleague
you re using a confocal microscope to detect a the PL of very reduced sample surface.
the solution i suggest to you is to use a non linear cystal (LiIO3 for example) in detection so that the phase-matching takes place without any troubles.
for any other details please see my old papers.
for any extra question dont hesitate
best regards
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