it depends on the inclusion. I usually use a good polishing and no etching
Some polishing and etching, in some cases, can remove the inclusion or change it. A good solution to observe inclusions or precipitates is using the SEM technique. You can observe the inclusion In the secondary electons mode or in the backscatering mode. In the SEM you dont need change the surface physical or chemically. Best regards
Sometimes is a good practice study the same specimen before and after etching. As Ricardo says can be used SEM. I usually use microhardness indentations to mark the area to be studied
Some of the specification dictate the sample prep.
Regardless of the method it is prudent to look at the sample at each stage of preparation, from macro on down. If you see things vanish then go back and modify the surface prep practice.
Don't finish the sample any finer than you need for the measurements. The risk of damage and artifacts increases.
- Badges
- Science topic
- Similar topics
- Engineering
- Materials Engineering