The topic is interesting. You may find important resource from the paper given below.
Bai, X., Fang, Y., Lin, W., Wang, L., & Ju, B. F. (2014). Saliency-based defect detection in industrial images by using phase spectrum. IEEE Trans. Industrial Informatics, 10(4), 2135-2145.
The topic is interesting. You may find important resource from the paper given below.
Bai, X., Fang, Y., Lin, W., Wang, L., & Ju, B. F. (2014). Saliency-based defect detection in industrial images by using phase spectrum. IEEE Trans. Industrial Informatics, 10(4), 2135-2145.