i perform short scan of alloy surface before argon ion etching, i get the C1s peak at BE 284.6ev .then i do Ar ion sputtering for 30min then i get C1s peaK with one extra shoulder (see the fig) , and when i do short scan of all other elements,it get the same BE peak as without sputtering and also match with standard peak. so i am confuse which C1s peak shoulder i select for caliberation and shifting of other peak.
and same situation occur in each cycle ( i perform 5 no.of cycle ) and if i calibrate and shift it not matches with standard.
Regards
saurav
Is your sample conducting???
Was it a thin film..if yes then what was the substrate you used??
As far my experience,
For conducting film in general no shift of B.E should be expected.
What is the component peak that appears above 300 eV? Does it appear before you sputter?
I might suggest that you have an Auger peak that is overlapping in the C1s region.
thank you sir for reply
sir, i dont get such pattern before sputtering at 300ev
Then I would look carefully at the entire region, not just the one new peak. This "feels" very much as though you have an Auger peak.
Also, you would do well combine multiple, similar questions in to just one. When multiple different questions are posted but all of them are asking essentially the same thing, any one person will have difficulty to track and respond properly. For example, I cannot remember whether someone else already answered this same question in one of your other two postings (that are asking about the same spectrum).
What is your sample? The shoulder is to the lower energy side of the original C 1s peak and suggests that you form a carbide after sputtering. This is very common.
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